"Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning ..."

Yue Zhao et al. (2016)

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DOI: 10.1145/2875422

access: closed

type: Journal Article

metadata version: 2021-11-18

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Yue Zhao, Taeyoung Kim, Hosoon Shin, Sheldon X.-D. Tan, Xin Li, Hai-Bao Chen, Hai Wang:
Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection. ACM Trans. Design Autom. Electr. Syst. 21(4): 56:1-56:21 (2016)

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