"Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design."

Cong Xu et al. (2015)

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DOI: 10.1145/2753759

access: closed

type: Journal Article

metadata version: 2023-03-21

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Cong Xu, Dimin Niu, Yang Zheng, Shimeng Yu, Yuan Xie:
Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design. ACM Trans. Design Autom. Electr. Syst. 20(4): 63:1-63:21 (2015)

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