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"Layout-aware scan chain reorder for launch-off-shift transition test coverage."
Sying-Jyan Wang et al. (2008)
- Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, Katherine Shu-Min Li:
Layout-aware scan chain reorder for launch-off-shift transition test coverage. ACM Trans. Design Autom. Electr. Syst. 13(4): 64:1-64:16 (2008)
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