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"Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems."

Ruijing Shen et al. (2012)

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DOI: 10.1145/2348839.2348855

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/todaes/ShenTWX12
Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong:
Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems. ACM Trans. Design Autom. Electr. Syst. 17(4): 51:1-51:19 (2012)

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