"Confidence analysis for defect-level estimation of VLSI random testing."

Wen-Ben Jone, K. S. Tsai (1998)

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DOI: 10.1145/293625.293629

access: closed

type: Journal Article

metadata version: 2018-11-06

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Wen-Ben Jone, K. S. Tsai:
Confidence analysis for defect-level estimation of VLSI random testing. ACM Trans. Design Autom. Electr. Syst. 3(3): 389-407 (1998)

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