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"On the properties of the input pattern fault model."

Ronald D. Blanton, John P. Hayes (2003)

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DOI: 10.1145/606603.606609

access: closed

type: Journal Article

metadata version: 2018-11-06

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Ronald D. Blanton, John P. Hayes:
On the properties of the input pattern fault model. ACM Trans. Design Autom. Electr. Syst. 8(1): 108-124 (2003)

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