"Error Resilient Estimation and Adaptive Binary Selection for Fast and ..."

Jongho Park, Tae-Jin Lee (2012)

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DOI: 10.1109/TMC.2011.112

access: closed

type: Journal Article

metadata version: 2023-03-22

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Jongho Park, Tae-Jin Lee:
Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel. IEEE Trans. Mob. Comput. 11(6): 959-969 (2012)

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