"Reducing I/O variability using dynamic I/O path characterization in ..."

Seung Woo Son et al. (2017)

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DOI: 10.1007/S11227-016-1904-7

access: closed

type: Journal Article

metadata version: 2023-09-30

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Seung Woo Son, Saba Sehrish, Wei-keng Liao, Ron A. Oldfield, Alok N. Choudhary:
Reducing I/O variability using dynamic I/O path characterization in petascale storage systems. J. Supercomput. 73(5): 2069-2097 (2017)

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