"Ionizing radiation effects on ULSI device yield and reliability."

A. Reisman (1990)

> Home

Details and statistics

DOI: 10.1007/BF00127836

access: closed

type: Journal Article

metadata version: 2020-05-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tjs/Reisman90
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tjs/Reisman90
A. Reisman:
Ionizing radiation effects on ULSI device yield and reliability. J. Supercomput. 4(3): 301-310 (1990)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.