"A small defect detection technique for industrial product surfaces based ..."

Biao Li et al. (2025)

> Home

Details and statistics

DOI: 10.1007/S11227-025-06929-0

access: closed

type: Journal Article

metadata version: 2025-01-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tjs/LiWHZJ25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tjs/LiWHZJ25
Biao Li, Bing Wang, Xiong Hu, Jianhui Zhai, Changping Ji:
A small defect detection technique for industrial product surfaces based on the EA-YOLO model. J. Supercomput. 81(2): 415 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.