"Machine learning-based defect prediction model using multilayer perceptron ..."

Sapna Juneja et al. (2024)

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DOI: 10.1007/S11227-023-05836-6

access: closed

type: Journal Article

metadata version: 2025-03-03

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Sapna Juneja, Ali Nauman, Mudita Uppal, Deepali Gupta, Roobaea Alroobaea, Bahodir Muminov, Yuning Tao:
Machine learning-based defect prediction model using multilayer perceptron algorithm for escalating the reliability of the software. J. Supercomput. 80(7): 10122-10147 (2024)

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