"Sequential Pattern Mining of Longitudinal Adverse Events After Left ..."

Faezeh Movahedi et al. (2020)

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DOI: 10.1109/JBHI.2019.2958714

access: closed

type: Journal Article

metadata version: 2020-12-01

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Faezeh Movahedi, Robert L. Kormos, Lisa C. Lohmueller, Laura Seese, Manreet K. Kanwar, Srinivas Murali, Yiye Zhang, Rema Padman, James F. Antaki:
Sequential Pattern Mining of Longitudinal Adverse Events After Left Ventricular Assist Device Implant. IEEE J. Biomed. Health Informatics 24(8): 2347-2358 (2020)

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