"Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling."

Dae Woo Kim et al. (2019)

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DOI: 10.1109/TIP.2019.2910389

access: closed

type: Journal Article

metadata version: 2024-10-06

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Dae Woo Kim, Camilo Aguilar, Huixi Zhao, Mary L. Comer:
Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling. IEEE Trans. Image Process. 28(10): 5064-5076 (2019)

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