"Deep Adversarial Metric Learning."

Yueqi Duan et al. (2020)

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DOI: 10.1109/TIP.2019.2948472

access: closed

type: Journal Article

metadata version: 2020-05-30

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Yueqi Duan, Jiwen Lu, Wenzhao Zheng, Jie Zhou:
Deep Adversarial Metric Learning. IEEE Trans. Image Process. 29: 2037-2051 (2020)

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