"Efficient Conflict-Filtered Network for Defect Detection."

Yuting Zheng et al. (2023)

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DOI: 10.1109/TIM.2023.3293557

access: closed

type: Journal Article

metadata version: 2023-08-05

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Yuting Zheng, Wentao Lyu, Chengqun Wang, Qing Guo, Di Zhou, Weiqiang Xu:
Efficient Conflict-Filtered Network for Defect Detection. IEEE Trans. Instrum. Meas. 72: 1-14 (2023)

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