"Class Imbalance Wafer Defect Pattern Recognition Based on Shared-Database ..."

Yong Zhang et al. (2024)

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DOI: 10.1109/TIM.2024.3395316

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type: Journal Article

metadata version: 2024-05-17

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Yong Zhang, Rukai Lan, Xianhe Li, Jingzhong Fang, Zuowei Ping, Weibo Liu, Zidong Wang:
Class Imbalance Wafer Defect Pattern Recognition Based on Shared-Database Decentralized Federated Learning Framework. IEEE Trans. Instrum. Meas. 73: 1-17 (2024)

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