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"Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: ..."
Zheng Zeng et al. (2021)
- Zheng Zeng
, Jin Wang
, Liang Wang
, Yue Yu
, Kaihong Ou
:
Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: Modelization, Characterization, and Validation. IEEE Trans. Instrum. Meas. 70: 1-14 (2021)

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