"Embedded loopback test for RF ICs."

Jangsup Yoon, William R. Eisenstadt (2005)

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DOI: 10.1109/TIM.2005.855091

access: closed

type: Journal Article

metadata version: 2024-10-06

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Jangsup Yoon, William R. Eisenstadt:
Embedded loopback test for RF ICs. IEEE Trans. Instrum. Meas. 54(5): 1715-1720 (2005)

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