"A translinear RMS detector for embedded test of RF ICs."

Qizhang Yin et al. (2005)

> Home

Details and statistics

DOI: 10.1109/TIM.2005.855105

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/YinEFZ05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/YinEFZ05
Qizhang Yin, William R. Eisenstadt, Robert M. Fox, Tao Zhang:
A translinear RMS detector for embedded test of RF ICs. IEEE Trans. Instrum. Meas. 54(5): 1708-1714 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.