"Clustering Federated Learning for Wafer Defects Classification on ..."

Guang Yang et al. (2024)

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DOI: 10.1109/TIM.2024.3415785

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type: Journal Article

metadata version: 2024-10-03

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Guang Yang, Zhijia Yang, Shuping Cui, Chunhe Song, Jizhou Wang, Haodong Wei:
Clustering Federated Learning for Wafer Defects Classification on Statistical Heterogeneous Data. IEEE Trans. Instrum. Meas. 73: 1-13 (2024)

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