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"Methods of Handling the Tolerance and Test-Point Selection Problem for ..."
Chenglin Yang et al. (2011)
- Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis. IEEE Trans. Instrum. Meas. 60(1): 176-185 (2011)
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