"Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter ..."

Aihua Wu et al. (2020)

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DOI: 10.1109/TIM.2019.2929671

access: closed

type: Journal Article

metadata version: 2021-12-25

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Aihua Wu, Xingchang Fu, Chen Liu, Chong Li, Yibang Wang, Faguo Liang, Peng Luan:
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems. IEEE Trans. Instrum. Meas. 69(6): 2837-2844 (2020)

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