"Using the Allan variance and power spectral density to characterize DC ..."

Thomas J. Witt (2001)

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DOI: 10.1109/19.918162

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type: Journal Article

metadata version: 2020-06-08

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Thomas J. Witt:
Using the Allan variance and power spectral density to characterize DC nanovoltmeters. IEEE Trans. Instrum. Meas. 50(2): 445-448 (2001)

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