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"Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With ..."
Xianshun Wang et al. (2022)
- Xianshun Wang, Dongchen Zhu, Wenjun Shi, Jun Liu, Fengjie Fu, Jiamao Li, Xiaolin Zhang:
Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens. IEEE Trans. Instrum. Meas. 71: 1-9 (2022)
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