"Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With ..."

Xianshun Wang et al. (2022)

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DOI: 10.1109/TIM.2021.3137156

access: closed

type: Journal Article

metadata version: 2022-03-15

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Xianshun Wang, Dongchen Zhu, Wenjun Shi, Jun Liu, Fengjie Fu, Jiamao Li, Xiaolin Zhang:
Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens. IEEE Trans. Instrum. Meas. 71: 1-9 (2022)

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