"Design of a Wideband System for Measuring Dielectric Properties."

Xiangzhen Wang, Wen Geyi (2017)

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DOI: 10.1109/TIM.2016.2619019

access: closed

type: Journal Article

metadata version: 2020-06-08

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Xiangzhen Wang, Wen Geyi:
Design of a Wideband System for Measuring Dielectric Properties. IEEE Trans. Instrum. Meas. 66(1): 69-76 (2017)

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