"A Self-Trained, Low-Complexity Method for Detecting Faults in Analog Circuits."

Vassilios D. Vassios et al. (2025)

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DOI: 10.1109/TIM.2025.3542098

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type: Journal Article

metadata version: 2025-03-11

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Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Kyriakos Tsiakmakis, Dimitrios K. Papakostas:
A Self-Trained, Low-Complexity Method for Detecting Faults in Analog Circuits. IEEE Trans. Instrum. Meas. 74: 1-13 (2025)

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