"Broadband Characterization of Thin Dielectrics Using Heterolayer and ..."

Yunsang Shin et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TIM.2022.3200364

access: closed

type: Journal Article

metadata version: 2024-07-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/ShinNHN22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/ShinNHN22
Yunsang Shin, Seung-Geol Nam, Jinseong Heo, Sangwook Nam:
Broadband Characterization of Thin Dielectrics Using Heterolayer and Monolayer MIM Capacitors. IEEE Trans. Instrum. Meas. 71: 1-8 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.