"A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence ..."

Junyou Shi et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TIM.2019.2905307

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/ShiDWH20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/ShiDWH20
Junyou Shi, Yi Deng, Zili Wang, Qingjie He:
A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers. IEEE Trans. Instrum. Meas. 69(3): 782-793 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.