"Comparison of contactless measurement and testing techniques to a ..."

Selahattin Sayil, David V. Kerns Jr., Sherra E. Kerns (2005)

> Home

Details and statistics

DOI: 10.1109/TIM.2005.854253

access: closed

type: Journal Article

metadata version: 2024-11-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/SayilKK05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/SayilKK05
Selahattin Sayil, David V. Kerns Jr., Sherra E. Kerns:
Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method. IEEE Trans. Instrum. Meas. 54(5): 2082-2089 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.