"Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor ..."

Gert Rietveld et al. (2013)

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DOI: 10.1109/TIM.2012.2225917

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/RietveldBKEMJ13
Gert Rietveld, Jan H. N. van der Beek, Marlin Kraft, Randolph E. Elmquist, Alessandro Mortara, Beat Jeckelmann:
Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior. IEEE Trans. Instrum. Meas. 62(6): 1723-1728 (2013)

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