"On-wafer measurements of noise temperature."

James Randa, Robert L. Billinger, John L. Rice (1999)

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DOI: 10.1109/19.816146

access: closed

type: Journal Article

metadata version: 2020-06-08

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James Randa, Robert L. Billinger, John L. Rice:
On-wafer measurements of noise temperature. IEEE Trans. Instrum. Meas. 48(6): 1259-1269 (1999)

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