"Optical measurement system for characterizing compound semiconductor ..."

Matthias Passlack et al. (1998)

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DOI: 10.1109/19.746611

access: closed

type: Journal Article

metadata version: 2020-06-08

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Matthias Passlack, Ronald N. Legge, Diana Convey, Zhiyi Yu, Jonathan K. Abrokwah:
Optical measurement system for characterizing compound semiconductor interface and surface states. IEEE Trans. Instrum. Meas. 47(5): 1362-1366 (1998)

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