"Defect Classification With SVM and Wideband Excitation in Multilayer ..."

Dario Jeronimo Pasadas et al. (2020)

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DOI: 10.1109/TIM.2019.2893009

access: closed

type: Journal Article

metadata version: 2024-01-26

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Dario Jeronimo Pasadas, Helena Maria Geirinhas Ramos, Bo Feng, Prashanth Baskaran, Artur Lopes Ribeiro:
Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates. IEEE Trans. Instrum. Meas. 69(1): 241-248 (2020)

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