"A deterministic dynamic element matching approach for testing ..."

Beatriz Olleta et al. (2006)

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DOI: 10.1109/TIM.2006.873821

access: closed

type: Journal Article

metadata version: 2022-07-26

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Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. 55(3): 902-915 (2006)

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