"A built-in self-testing method for embedded multiport memory arrays."

Vinod Narayanan et al. (2005)

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DOI: 10.1109/TIM.2005.855093

access: closed

type: Journal Article

metadata version: 2020-06-08

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Vinod Narayanan, Swaroop Ghosh, Wen-Ben Jone, Sunil R. Das:
A built-in self-testing method for embedded multiport memory arrays. IEEE Trans. Instrum. Meas. 54(5): 1721-1738 (2005)

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