"Composite Wafer Defect Recognition Framework Based on Multiview Dynamic ..."

Wenjun Luo, Huan Wang (2023)

> Home

Details and statistics

DOI: 10.1109/TIM.2023.3261924

access: closed

type: Journal Article

metadata version: 2023-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/LuoW23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/LuoW23
Wenjun Luo, Huan Wang:
Composite Wafer Defect Recognition Framework Based on Multiview Dynamic Feature Enhancement With Class-Specific Classifier. IEEE Trans. Instrum. Meas. 72: 1-12 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.