"Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline ..."

Peng Luan et al. (2020)

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DOI: 10.1109/TIM.2020.2995970

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type: Journal Article

metadata version: 2024-04-08

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Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu, Jing Du:
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE Trans. Instrum. Meas. 69(11): 8874-8880 (2020)

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