"Measurement Technique for the Static Output Characterization of ..."

Toni López, Reinhold Elferich (2007)

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DOI: 10.1109/TIM.2007.900146

access: closed

type: Journal Article

metadata version: 2023-02-10

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Toni López, Reinhold Elferich:
Measurement Technique for the Static Output Characterization of High-Current Power MOSFETs. IEEE Trans. Instrum. Meas. 56(4): 1347-1354 (2007)

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