"Particle Metrology and Classification Instrumentation Based on ..."

Jingwen Li, Ruqiang Zhao, Jiefang Bi (2024)

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DOI: 10.1109/TIM.2024.3396861

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type: Journal Article

metadata version: 2024-10-03

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Jingwen Li, Ruqiang Zhao, Jiefang Bi:
Particle Metrology and Classification Instrumentation Based on Dual-Wavelength Illumination and Modulated Polarization Detection. IEEE Trans. Instrum. Meas. 73: 1-11 (2024)

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