"Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz."

John R. Labenski et al. (2007)

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DOI: 10.1109/TIM.2007.891070

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type: Journal Article

metadata version: 2021-10-14

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John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr.:
Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE Trans. Instrum. Meas. 56(2): 481-485 (2007)

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