"Electrical Performance of the Recessed Probe Launch Technique for ..."

Miroslav Kotzev et al. (2012)

> Home

Details and statistics

DOI: 10.1109/TIM.2012.2211471

access: closed

type: Journal Article

metadata version: 2021-03-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/KotzevRKBGS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/KotzevRKBGS12
Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster:
Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. IEEE Trans. Instrum. Meas. 61(12): 3198-3206 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.