"Accurate testing of analog-to-digital converters using low linearity ..."

Le Jin et al. (2005)

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DOI: 10.1109/TIM.2005.847240

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type: Journal Article

metadata version: 2022-07-26

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Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54(3): 1188-1199 (2005)

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