"Model tests to investigate the effects of geometrical imperfections on the ..."

Anne-Marie Jeffery, Lai H. Lee, John Q. Shields (1999)

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DOI: 10.1109/19.769600

access: closed

type: Journal Article

metadata version: 2020-06-08

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Anne-Marie Jeffery, Lai H. Lee, John Q. Shields:
Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor. IEEE Trans. Instrum. Meas. 48(2): 356-359 (1999)

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