"Deep Residual Neural Network-Based Defect Detection on Complex Backgrounds."

Chao-Ching Ho et al. (2022)

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DOI: 10.1109/TIM.2022.3144224

access: closed

type: Journal Article

metadata version: 2022-03-15

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Chao-Ching Ho, Miguel Angel Benalcázar Hernández, Yi-Fan Chen, Chih-Jer Lin, Chin-Sheng Chen:
Deep Residual Neural Network-Based Defect Detection on Complex Backgrounds. IEEE Trans. Instrum. Meas. 71: 1-10 (2022)

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