"Electromagnetic characterization of layered materials via direct and ..."

Michael J. Havrilla, Dennis P. Nyquist (2006)

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DOI: 10.1109/TIM.2005.861249

access: closed

type: Journal Article

metadata version: 2020-06-08

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Michael J. Havrilla, Dennis P. Nyquist:
Electromagnetic characterization of layered materials via direct and de-embed methods. IEEE Trans. Instrum. Meas. 55(1): 158-163 (2006)

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