"Electromagnetic Metrology for Nano- Electromechanical Systems."

Ling Hao, John C. Gallop, Jie Chen (2019)

> Home

Details and statistics

DOI: 10.1109/TIM.2018.2879068

access: closed

type: Journal Article

metadata version: 2020-06-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/HaoGC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/HaoGC19
Ling Hao, John C. Gallop, Jie Chen:
Electromagnetic Metrology for Nano- Electromechanical Systems. IEEE Trans. Instrum. Meas. 68(6): 1827-1832 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.