"Techniques for high-frequency integrated test and measurement."

Mohamed M. Hafed, Gordon W. Roberts (2003)

> Home

Details and statistics

DOI: 10.1109/TIM.2003.820449

access: closed

type: Journal Article

metadata version: 2022-10-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/HafedR03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/HafedR03
Mohamed M. Hafed, Gordon W. Roberts:
Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Meas. 52(6): 1780-1786 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.