"Noninvasive Fault Classification, Robustness and Recovery Time Measurement ..."

Hipólito Guzmán-Miranda, M. A. Aguirre, Jonathan Noel Tombs (2009)

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DOI: 10.1109/TIM.2009.2014603

access: closed

type: Journal Article

metadata version: 2020-10-26

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Hipólito Guzmán-Miranda, M. A. Aguirre, Jonathan Noel Tombs:
Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors. IEEE Trans. Instrum. Meas. 58(5): 1514-1524 (2009)

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