"Coefficient-based test of parametric faults in analog circuits."

Zhen Guo, Jacob Savir (2006)

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DOI: 10.1109/TIM.2005.861490

access: closed

type: Journal Article

metadata version: 2020-06-08

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Zhen Guo, Jacob Savir:
Coefficient-based test of parametric faults in analog circuits. IEEE Trans. Instrum. Meas. 55(1): 150-157 (2006)

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