"Deep Learning-Based Binocular Image Analysis for In Situ Measurement of ..."

Ji Fan et al. (2023)

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DOI: 10.1109/TIM.2023.3330217

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type: Journal Article

metadata version: 2025-01-21

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Ji Fan, Tao Liu, Yongcan Shuang, Bo Song, Junghui Chen, Yonghong Tan:
Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process. IEEE Trans. Instrum. Meas. 72: 1-14 (2023)

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